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1

Gate insulators and interface effects in organic thin-film transistors

F.A. Yildirim, R.R. Schliewe, W. Bauhofer, R.M. Meixner, H. Goebel, W. Krautschneider

Journal:

Organic Electronics

Year:

2008

Language:

english

File:

PDF, 643 KB

english, 2008

2

A Physical-Based PSPICE Compact Model for Poly(3-hexylthiophene) Organic Field-Effect Transistors

Meixner, R.M., Gobel, H.H., Haidi Qiu, Ucurum, C., Klix, W., Stenzel, R., Yildirim, F.A., Bauhofer, W., Krautschneider, W.H.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 278 KB

english, 2008

3

SPIE Proceedings [SPIE Microtechnologies for the New Millennium 2005 - Sevilla, Spain (Monday 9 May 2005)] VLSI Circuits and Systems II - Single poly PMOS-based CMOS-compatible low voltage OTP

Vega-Castillo, Paola, Krautschneider, Wolfgang H., Lopez, Jose F., Fernandez, Francisco V., Lopez-Villegas, Jose Maria, de la Rosa, Jose M.

Year:

2005

Language:

english

File:

PDF, 213 KB

english, 2005

4

Charge-based capacitance measurements (CBCM) on MOS devices

Sell, B., Avellan, A., Krautschneider, W.H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2002

Language:

english

File:

PDF, 201 KB

english, 2002

5

Reliability problems of submicron MOS transistors and circuits

Wolfgang H. Krautschneider, Hartmud Terletzki, Qin Wang

Journal:

Microelectronics Reliability

Year:

1992

Language:

english

File:

PDF, 827 KB

english, 1992

6

Reliability issues of scaled-down MOS transistors for gigabit circuits

Wolfgang H. Krautschneider

Journal:

Microelectronics Reliability

Year:

1995

Language:

english

File:

PDF, 745 KB

english, 1995

7

Scaling down and reliability problems of gigabit CMOS circuits

W.H. Krautschneider, A. Kohlhase, H. Terletzki

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 1.08 MB

english, 1997

8

A flexible system-on-chip (SoC) for biomedical signal acquisition and processing

N. Van Helleputte, J.M. Tomasik, W. Galjan, A. Mora-Sanchez, D. Schroeder, W.H. Krautschneider, R. Puers

Journal:

Sensors and Actuators A: Physical

Year:

2008

Language:

english

File:

PDF, 964 KB

english, 2008

9

Chemical vapor deposition of tungsten silicide (WSix) for high aspect ratio applications

B. Sell, A. Sänger, G. Schulze-Icking, K. Pomplun, W. Krautschneider

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 765 KB

english, 2003

10

Interface characteristics between tungsten silicide electrodes and thin dielectrics

B. Sell, J. Willer, K. Pomplun, A. Sänger, D. Schumann, W. Krautschneider

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 503 KB

english, 2001

11

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - Array Test Structure for Ultra-Thin Gate Oxide Degradation Issues

Hafkemeyer, Kristian M., Domdey, Andreas, Schroeder, Dietmar, Krautschneider, Wolfgang H.

Year:

2009

Language:

english

File:

PDF, 961 KB

english, 2009

12

Impact of Soft and Hard Breakdown on Analog and Digital Circuits

Avellan, A., Krautschneider, W.H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2004

Language:

english

File:

PDF, 302 KB

english, 2004

13

[IEEE 2010 International Conference on Indoor Positioning and Indoor Navigation (IPIN) - Zurich, Switzerland (2010.09.15-2010.09.17)] 2010 International Conference on Indoor Positioning and Indoor Navigation - Indoor navigation of machines and measuring devices with iGPS

Schwendemann, J., Muller, Tilman, Krautschneider, R.

Year:

2010

Language:

english

File:

PDF, 752 KB

english, 2010

14

Understanding the Mechanisms of Degradation and Failure Observed in ESD Protection Devices Under System-Level Tests

Zhihao Pan,, Holland, Steffen, Schroeder, Dietmar, Krautschneider, Wolfgang H

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2010

Language:

english

File:

PDF, 654 KB

english, 2010

15

Post Hard Breakdown Conduction in MOS Capacitors With Silicon and Aluminum Oxide as Dielectric

Avellan, A., Jakschik, S., Tippelt, B., Kudelka, S., Krautschneider, W.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 338 KB

english, 2008

16

[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - Asynchronous Staggered Set/Reset Techniques for Low-Noise Applications

Rimolo-Donadio, Renato, Acosta, Antonio J., Krautschneider, Wolfgang

Year:

2007

Language:

english

File:

PDF, 521 KB

english, 2007

17

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - A Stent Graft Occlusion Detection : Pressure Sensing Implant Device with Inductive Power and Data Telemetry

John, Bibin, Spink, Clemens, Braunschweig, Markus, Ranjan, Rajeev, Schroeder, Dietmar, Koops, Andreas, Woldt, Gregor, Rauh, Ilka, Leuzinger, Andreas, Adam, Gerhard, Krautschneider, Wolfgang H.

Year:

2018

Language:

english

File:

PDF, 1.22 MB

english, 2018

18

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Integration of Double Barrier Memristor Die with Neuron ASIC for Neuromorphic Hardware Learning

Ranjan, Rajeev, Hansen, Mirko, Ponce, Pablo Mendoza, Saleh, Lait Abu, Schroeder, Dietmar, Ziegler, Martin, Kohlstedt, Hermann, Krautschneider, Wolfgang H.

Year:

2018

Language:

english

File:

PDF, 3.24 MB

english, 2018

19

Wireless Power Transmission for Powering Medical Implants Situated in an Abdominal Aortic Aneurysm

Bradford, B T, Krautschneider, W, Schroeder, D

Journal:

Biomedical Engineering/ Biomedizinische Technik

Year:

2012

File:

PDF, 774 KB

2012

20

[IEEE 2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS) - San Jose, Costa Rica (2020.2.25-2020.2.28)] 2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS) - A 16-bit Pressure Sensing Interface Integrating a 460 fJ/conv Incremental Sigma Delta ADC for Medical Devices

Solis-Arbustini, Johan, Mendoza-Ponce, Pablo, Krautschneider, Wolfgang H., Kuhl, Matthias

Year:

2020

File:

PDF, 475 KB

2020

21

Fully scalable gain memory cell for future drams

W.H. Krautschneider, L. Risch, K. Lau, D. Schmitt-Landsiedel

Journal:

Microelectronic Engineering

Year:

1991

Language:

english

File:

PDF, 185 KB

english, 1991

22

Time dependence of hot-carrier degradation in LDD nMOSFETs

Q. Wang, W.H. Krautschneider, M. Brox, W. Weber

Journal:

Microelectronic Engineering

Year:

1991

Language:

english

File:

PDF, 193 KB

english, 1991

23

Bottom gate organic field effect transistors made by laser structuring

Ronald M. Meixner, Rocco Wille, Peter Schertling, Holger Goebel, H. Harde, K.-H. Steglich, F.A. Yildirim, W. Bauhofer, W. Krautschneider

Journal:

Organic Electronics

Year:

2006

Language:

english

File:

PDF, 536 KB

english, 2006

24

DRAM retention tail improvement by trap passivation

A. Weber, A. Birner, W. Krautschneider

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 675 KB

english, 2007

25

Impact of parasitic elements on the performance of digital CMOS circuits with Gigabit feature size

Stefan Schwantes, Ralf Göttsche, Wolfgang Krautschneider

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 131 KB

english, 2003

26

Reliability of ultra thin oxide and nitride films in the 1 nm to 2 nm range

B. Yuwono, T. Schloesser, A. Gschwandtner, G. Innertsberger, A. Grassl, A. Olbrich, W.H. Krautschneider

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 223 KB

english, 1999

27

An accurate MOS measurement procedure for work function difference in the Al/SiO2/Si system

W.H. Krautschneider, J. Laschinski, W. Seifert, H.G. Wagemann

Journal:

Solid-State Electronics

Year:

1986

Language:

english

File:

PDF, 822 KB

english, 1986

28

Consistent model for the voltage and temperature dependence of the soft breakdown conduction mechanism in ultrathin gate oxides

A Avellán, E Miranda, D Schroeder, W Krautschneider

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 302 KB

english, 2004

29

Method of activation energy analysis and application to individual cells of 256Mb DRAM in 110 nm technology

A. Weber, A. Birner, W. Krautschneider

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 503 KB

english, 2006

30

Photoproduction of charged pions from deuterium at gamma-energies from 900 to 1,800 MeV and pion angles between 65 and 125°

H. -J. Besch, F. Krautschneider, K. -P. Sternemann, W. Vollrath

Journal:

Zeitschrift für Physik C Particles and Fields

Year:

1982

Language:

english

File:

PDF, 434 KB

english, 1982

31

Vertical MOS transistors with 70 nm channel length

Risch, L., Krautschneider, W.H., Hofmann, F., Schafer, H., Aeugle, T., Rosner, W.

Journal:

IEEE Transactions on Electron Devices

Year:

1996

Language:

english

File:

PDF, 559 KB

english, 1996

32

Photoproduction of φ mesons on protons at 2.0 GeV

H.J. Besch, G. Hartmann, R. Kose, F. Krautschneider, W. Paul, U. Trinks

Journal:

Nuclear Physics B

Year:

1974

Language:

english

File:

PDF, 589 KB

english, 1974

33

Array Test Structures for Gate Dielectric Integrity Measurements and Statistics

Hafkemeyer, K.M., Domdey, A., Schroeder, D., Krautschneider, W.H.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2012

Language:

english

File:

PDF, 5.74 MB

english, 2012

34

[IEEE 2009 3rd International Conference on Signals, Circuits and Systems (SCS 2009) - Medenine, Tunisia (2009.11.6-2009.11.8)] 2009 3rd International Conference on Signals, Circuits and Systems (SCS) - 12-bit hybrid C2C DAC based SAR ADC with floating voltage shield

Balasubramaniam, Harish, Galjan, Wjatscheslaw, Krautschneider, Wolfgang H., Neubauer, Harald

Year:

2009

Language:

english

File:

PDF, 357 KB

english, 2009

35

[IEEE IEEE EUROCON 2009 (EUROCON) - St. Petersburg, Russia (2009.05.18-2009.05.23)] IEEE EUROCON 2009 - Highly sensitive biomedical amplifier with CMRR calibration and DC-offset compensation

Galjan, Wjatscheslaw, Hafkemeyer, Kristian M., Tomasik, Jakob M., Wagner, Fabian, Krautschneider, Wolfgang H., Schroeder, Dietmar

Year:

2009

Language:

english

File:

PDF, 705 KB

english, 2009

36

Synthesis of an organic conductive porous material using starch aerogels as template for chronic invasive electrodes

Starbird, Ricardo, García-González, Carlos A., Smirnova, Irina, Krautschneider, Wolfgang H., Bauhofer, Wolfgang

Journal:

Materials Science and Engineering: C

Year:

2014

Language:

english

File:

PDF, 1.19 MB

english, 2014

37

Spin-cast composite gate insulation for low driving voltages and memory effect in organic field-effect transistors

F. A. Yildirim, C. Ucurum, R. R. Schliewe, W. Bauhofer, R. M. Meixner, H. Goebel, W. Krautschneider

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 357 KB

english, 2007

38

[IEEE 2012 5th Biomedical Engineering International Conference (BMEiCON) - Muang, Ubon Ratchathani, Thailand (2012.12.5-2012.12.7)] The 5th 2012 Biomedical Engineering International Conference - Capacitive sensors for detection of the movement artifacts in active capacitive electrocardiography electrodes

Hosseini, Farzad, Schroeder, Dietmar, Krautschneider, Wolfgang H.

Year:

2012

Language:

english

File:

PDF, 836 KB

english, 2012

39

An integrated stent-graft for noninvasive 4-dimensional aneurysm sac pressure monitoring after endovascular aortic aneurysm repair (EVAR): First in vivo results in a porcine model

Koops, A., Bradford, B.T., Schroeder, D., Krautschneider, W.H., Adam, G., Buhk, J.H.

Journal:

Journal of Vascular and Interventional Radiology

Year:

2013

Language:

english

File:

PDF, 35 KB

english, 2013

40

[IEEE 2009 NORCHIP - Trondheim, Norway (2009.11.16-2009.11.17)] 2009 NORCHIP - Reliability analysis of gate dielectrics by applying array test structures and automated test systems

Domdey, Andreas, Hafkemeyer, Kristian M., Schroeder, Dietmar, Krautschneider, Wolfgang H.

Year:

2009

Language:

english

File:

PDF, 542 KB

english, 2009

41

[IEEE 2008 NORCHIP - Tallin, Estonia (2008.11.16-2008.11.17)] 2008 NORCHIP - A 130nm CMOS Programmable Operational Amplifier

Tomasik, Jakob M., Hafkemeyer, Kristian M., Galjan, Wjatscheslaw, Schroeder, Dietmar, Krautschneider, Wolfgang H.

Year:

2008

Language:

english

File:

PDF, 365 KB

english, 2008

42

[IEEE 2012 5th International Conference on Biomedical Engineering and Informatics (BMEI) - Chongqing, China (2012.10.16-2012.10.18)] 2012 5th International Conference on BioMedical Engineering and Informatics - Neuromuscular electrical stimulation using different waveforms: Properties comparison by applying single pulses

Meza-Cuevas, Mario A., Schroeder, Dietmar, Krautschneider, Wolfgang H.

Year:

2012

Language:

english

File:

PDF, 315 KB

english, 2012

43

Influence of MOSFET I-V characteristics on switching delay time of CMOS inverters after hot-carriers stress

Wang, Q., Krautschneider, W.H., Weber, W., Schmitt-Landsiedel, D.

Journal:

IEEE Electron Device Letters

Year:

1991

Language:

english

File:

PDF, 258 KB

english, 1991

44

Explanation and model for the logarithmic time dependence of p-MOSFET degradation

Wang, Q., Brox, M., Krautschneider, W.H., Weber, W.

Journal:

IEEE Electron Device Letters

Year:

1991

Language:

english

File:

PDF, 267 KB

english, 1991

45

[Japan Soc. Appl. Phys 1995 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (6-8 June 1995)] 1995 Symposium on VLSI Technology. Digest of Technical Papers - Planar gain cell for low voltage operation and gigabit memories

Krautschneider, W.H., Hofmann, F., Ruderer, E., Risch, L.

Year:

1995

Language:

english

File:

PDF, 211 KB

english, 1995

46

Understanding and Modeling of Diode Voltage Overshoots During Fast Transient ESD Events

Pan, Zhihao, Schroeder, Dietmar, Holland, Steffen, Krautschneider, Wolfgang H.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.45 MB

english, 2014

47

[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - MOSFET interface state densities of different technologies

Hofmann, F., Krautschneider, W.

Year:

1989

Language:

english

File:

PDF, 266 KB

english, 1989

48

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Efficient simulation framework for circuit design with future device technologies [MOS structures]

Gottsche, R., Schulz, T., Bruls, N., Krautschneider, W.

Year:

2004

Language:

english

File:

PDF, 227 KB

english, 2004

49

[Widerkehr & Associates 1996 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (11-13 June 1996)] 1996 Symposium on VLSI Technology. Digest of Technical Papers - ROS: an extremely high density mask ROM technology based on vertical transistor cells

Bertagnolli, E., Hofmann, F., Willer, J., Mary, R., Lau, F., von Basse, P.W., Bollu, M., Thewes, R., Kollmer, U., Zimmermann, U., Hain, M., Krautschneider, W.H., Rusch, A., Hasler, B., Kohlhase, A., K

Year:

1996

Language:

english

File:

PDF, 460 KB

english, 1996

50

[IEEE 2012 5th Biomedical Engineering International Conference (BMEiCON) - Muang, Ubon Ratchathani, Thailand (2012.12.5-2012.12.7)] The 5th 2012 Biomedical Engineering International Conference - Hybrid architecture of a DAC for Neurostimulation

Meza-Cuevas, Mario A., Ramesh, Karthik, Schroeder, Dietmar, Krautschneider, Wolfgang H.

Year:

2012

Language:

english

File:

PDF, 313 KB

english, 2012